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3030 series

MULTI-CORE   MULTI-FUNCTION   BOARD TESTER

True Parallel Test: 8x productivity
Ultra-fast test speed: lowest cost of test
Ultra-fast handling: 3 sec
Automated application development
100% Fault Coverage
Cost-effective Per Pin architecture
Precise contacting with motorized receiver
Fully upgradeable & customizable
1000+ of 3030 systems installed worldwide

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Product Description

3030 board tester range is a scalable in-circuit test platform that delivers the shortest test timesuperior diagnostic accuracy and full test coverage for the widest range of electronic products.

Inline automated or manual loading, con gurable, upgradable on  eld and reliable over years, 3030 board tester range meets the test and throughput needs of electronic manufacturers worldwide.

Multi-Core Architecture provides up to 8x greater productivity compared to conventional test equipment, dramatically lowering the cost of test.

Common hardware and software across the whole 3030 testers range mean same test result, easy test program migration and compatible spare parts.

Test program generation is quick and automatic with Leonardo OS which enables unskilled user to develop a test program in a very short time.

8x Productivity with Multi-Core

3030 board testers can be equipped with up to 8 independent Cores – each one with independent CPU, local memory and instrumentation – able to test in parallel up to 8 boards/panels of boards.
Compared to standard ICT testers, SPEA 3030 productivity is up to 800% higher, thus minimizing the cost of board testing.
Moreover, with Dual-Stage option, 3030 systems deliver different test techniques concurrently (e.g.: In-Circuit + Functional, In-Circuit + On-Board Programming etc…), optimizing the tests among the two stages and further reducing the time and costs.

Ultra-fast test speed

Compared to standard ATE, 3030 test speed is significantly higher. Dedicated CPU on each Core guarantees no delay between instrumentation and PC.
High-performance relays provide fast switching time. Instruments architectureminimizes instruments setup time during test.
Possibility to execute different measurements simultaneously, with a single test Core, further reduces the test time.

Ultra-fast handling

3030 IL is equipped with a re-designed handling module, which halves the handling time compared to previous generation.
Just 3 seconds are enough for handling a medium-size PCBA, including board loading, presser down, presser up and board unloading

Automated Application Development

  • Automatic test program generation in minutes
  • Automatic debug & tuning
  • Minimized application development costs: automatic generation of the file for fixture drilling and wiring
  • Automatic CAD data recognition & import
  • Automatic test report generation
  • User-friendly intuitive graphical interface
  • Real time production monitoring and analysis

Cost-effective Per Pin Architecture 


Each 3030 channel is configurable by test program.
Every nail can be used to perform any kind of test. This instrument/receiver 1:1 ratio guarantees several benefits: faster test generation, easy ECO management, full flexibility.

Fully upgradeable & customizable

3030 can be factory equipped or upgraded on field with all kind of instrumentation useful to satisfy the test requirements.
It is possible to integrate power instrumentation (as AC/DC generators, Active Loads, Power Matrix etc.) as well as third party instruments to increase test capabilities and productivity.

Forget field returns

3030 has been designed to help electronics manufacturers increase their product quality.  
By executing a complete range of test techniques with its high- performance instrumentation and stimuli, 3030 can reliably find faults undetectable by standard ICT tester.